名称：场发射透射电镜

型号：日本电子株式会社（JEOL）    

主要技术指标：

TEM resolution (at 200 kV)
Point image 0.19 nm
Lattice image 0.1 nm
STEM resolution (at 200 kV)
Dark-field lattice image 0.14 nm*1
Brightness (at 200 kV) 8×108A/cm2･sr or higher
Degree of vacuum 1 × 10-8 Pa or less (at the bottom of the acceleration tube)
TEM magnification (at 200 kV)
MAG ×2000 to 2.0 M
LOWMAG(OL OFF mode) ×20 to ×60 k
SCAN magnification (at 200 kV)
MAG ×20 k to 150 M
LOW MAG(OL OFF mode) ×100 to 2.0 M
Supported detectors STEM-DF, STEM-BF

主要功能：

TEM, HRTEM, STEM, SAED measurement for the mophorlogy and crystal structure of nanomaterials and bio-samples